Bias stability of OC48 X-cut lithium-niobate optical modulators: Four years of biased aging test results

IEEE Photonics Technology Letters

Volumn 15, Issue 1, 2003, Pages 42-44

  Nagata, Hirotoshi ^a   Papasavvas, Nektarios ^a   Maack, David R ^a  

^a JDS Uniphase Corporation   (United States)

Author keywords

Dc bias drift; Failure rate; Lithium niobate; Modulator; Reliability

Indexed keywords

ELECTRIC FREQUENCY MEASUREMENT; FAILURE ANALYSIS; LITHIUM NIOBATE; OPTICAL TESTING; VOLTAGE MEASUREMENT;

BIAS STABILITY; LITHIUM NIOBATE OPTICAL MODULATORS;

LIGHT MODULATORS;

EID: 0037252332     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2002.805866     Document Type: Article

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