La-214 thin films under epitaxial strain

Physica C: Superconductivity and its Applications

Volumn 408-410, Issue 1-4, 2004, Pages 848-852

  Sato, H ^a,c   Tsukada, A ^a   Naito, M ^a,b  

^a NTT Basic Research Laboratories   (Japan)

^b TOKYO UNIVERSITY OF SCIENCE   (Japan)

^c NTT Corporation   (Japan)

Author keywords

La 214; Strain effect; Thin films

Indexed keywords

EPITAXIAL STRAINS; LA-214; POISSON EFFECTS; STRAIN EFFECTS;

CHEMICAL BONDS; ELECTRIC CONDUCTIVITY; FERROMAGNETISM; HIGH TEMPERATURE SUPERCONDUCTORS; LANTHANUM COMPOUNDS; LATTICE CONSTANTS; PHASE DIAGRAMS; STRAIN; SUPERCONDUCTIVITY; X RAY DIFFRACTION ANALYSIS;

THIN FILMS;

EID: 4344622012     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2004.03.218     Document Type: Conference Paper

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