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Volumn 62, Issue 2, 2000, Pages R799-R802
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Absence of anomaly in strained thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 13944284541
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.62.R799 Document Type: Article |
Times cited : (63)
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References (36)
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