Displacive phase transition in SrTiO3 thin films grown on Si(001)

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 22, Issue 4, 2004, Pages 1356-1360

  Aguirre Tostado, F S ^a   Herrera Gomez A ^a   Woicik, J C ^b   Droopad, R ^c   Yu, Z ^c   Schlom, D G ^d   Karapetrova, J ^e   Zschack, P ^e   Pianetta, P ^f  

^a DEPARTAMENTO DE FÍSICA   (Mexico)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c MOTOROLA INC   (United States)

^d PENNSYLVANIA STATE UNIVERSITY   (United States)

^e UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^f SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; FERROELECTRICITY; LATTICE CONSTANTS; MOSFET DEVICES; PEROVSKITE; PHASE TRANSITIONS; POLARIZATION; SEMICONDUCTING SILICON; SILICA; STRONTIUM COMPOUNDS; TENSILE STRENGTH; THERMAL EXPANSION; X RAY DIFFRACTION ANALYSIS;

BRAGG REFLECTIONS; INVERSION SYMMETRY; LATTICE MISMATCH; QUANTUM FLUCTUATIONS;

ULTRATHIN FILMS;

EID: 4344620027     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1765657     Document Type: Conference Paper

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