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Volumn 565, Issue 2-3, 2004, Pages 173-179
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Surface free energy - A possible source of error in nanohardness?
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Author keywords
Atomic force microscopy; Semi empirical models and model calculations
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELASTIC MODULI;
ERROR ANALYSIS;
HARDNESS;
INTERFACIAL ENERGY;
MATHEMATICAL MODELS;
PLASTIC DEFORMATION;
STIFFNESS;
ELASTIC CONSTANTS;
NANOHARDNESS;
SEMI-EMPIRICAL MODELS;
SURFACE FREE ENERGY;
FREE ENERGY;
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EID: 4344614013
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2004.07.006 Document Type: Article |
Times cited : (17)
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References (19)
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