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Surface Science

Volumn 416, Issue 1-2, 1998, Pages

Determination of α and β site defects on graphite using C60-adsorbed STM tips

(2) Kelly, K F a Halas, N J a

a RICE UNIVERSITY (United States)

Author keywords

Fullerenes; Graphite; Scanning tunneling microscopy; Surface defects

Indexed keywords

ELECTRON SCATTERING; GRAPHITE; MATHEMATICAL MODELS; POINT DEFECTS; SCANNING TUNNELING MICROSCOPY;

SURFACE DEFECTS; VACANCIES;

FULLERENES;

EID: 0032179596 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(98)00622-0 Document Type: Article

Times cited : (82)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.