Spectroscopic ellipsometry studies of amorphous PZT thin films with various Zr/Ti stoichiometries

Journal of Materials Science

Volumn 37, Issue 18, 2002, Pages 3841-3845

  Yang, Shenghong ^a   Mo, Dang ^b   Tang, Xinggui ^c  

^a FUDAN UNIVERSITY   (China)

^b SUN YAT SEN UNIVERSITY   (China)

^c INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; COMPOSITION; ELLIPSOMETRY; FERROELECTRIC THIN FILMS; REFRACTIVE INDEX; SOL-GELS; STOICHIOMETRY; SURFACE ROUGHNESS;

EXTINCTION COEFFICIENT; LEAD ZIRCONATE TITANATE; OPTICAL BAND GAP ENERGIES; OPTICAL CONSTANTS; PACKING DENSITY; THICKNESS;

SEMICONDUCTING LEAD COMPOUNDS;

EID: 0037106784     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1019682817298     Document Type: Article

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