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Volumn 5469, Issue , 2004, Pages 320-327

Study of conductance fluctuations (1/fα noise) in metallic nanowires

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTANCE FLUCTUATIONS (CF); HOOGE'S FORMULA; METALLIC NANOWIRES; RELAXATIONS;

EID: 4344560937     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.545333     Document Type: Conference Paper
Times cited : (1)

References (10)
  • 1
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    • (1985) Phys. Rev. Lett. , vol.55 , pp. 2487-2490
    • Koch, R.H.1    Lloyd, J.R.2    Cronin, J.3
  • 2
    • 0026928451 scopus 로고
    • Prediction of electromigration failure in W/Al-Cu multilayered metallizations by 1/f noise measurements
    • Z. Celik-Butler and M. Ye, "Prediction of electromigration failure in W/Al-Cu multilayered metallizations by 1/f noise measurements", Solid-State Electron., 35, 1209-1212, (1992)
    • (1992) Solid-state Electron. , vol.35 , pp. 1209-1212
    • Celik-Butler, Z.1    Ye, M.2
  • 3
    • 0000209905 scopus 로고    scopus 로고
    • 1/f noise as an early indicator of electromigration damage in thin metal films
    • K. Dagge, W. Frank, A. Seeger, and H. Stoll, "1/f noise as an early indicator of electromigration damage in thin metal films", Appl. Phys. Lett. 68, 1198-1200,(1996)
    • (1996) Appl. Phys. Lett. , vol.68 , pp. 1198-1200
    • Dagge, K.1    Frank, W.2    Seeger, A.3    Stoll, H.4
  • 4
    • 0001370768 scopus 로고    scopus 로고
    • Electromigration in isolated aluminum vias probed by resistance changes and 1/f noise
    • G. B. Alers, N. L. Beverly, and A. S. Oats, "Electromigration in isolated aluminum vias probed by resistance changes and 1/f noise", J. Appl. Phys., 79, 7596-7603, (1996)
    • (1996) J. Appl. Phys. , vol.79 , pp. 7596-7603
    • Alers, G.B.1    Beverly, N.L.2    Oats, A.S.3
  • 5
    • 0036481366 scopus 로고    scopus 로고
    • Measurement of 1/f noise and its applications in materials science
    • For a general review in this field see A. K. Raychaudhuri, "Measurement of 1/f noise and its applications in materials science", Current opinions in Solid state and material Sciences, 60, 69-85, (2002)
    • (2002) Current Opinions in Solid State and Material Sciences , vol.60 , pp. 69-85
    • Raychaudhuri, K.1
  • 6
    • 0032615341 scopus 로고    scopus 로고
    • Analysis of failure mechanisms in electrically stressed Au nanowires
    • C. Durkan, M. A. Schneider, and M. E. Welland "Analysis of failure mechanisms in electrically stressed Au nanowires", J. Appl. Phys, 86, 1280-1286, (1999)
    • (1999) J. Appl. Phys , vol.86 , pp. 1280-1286
    • Durkan, C.1    Schneider, M.A.2    Welland, M.E.3
  • 7
    • 0347926410 scopus 로고    scopus 로고
    • α noise in metal films with electromigration damage
    • α noise in metal films with electromigration damage" Appl. Phys. Letts, 81, 5165-5167, (2002)
    • (2002) Appl. Phys. Letts , vol.81 , pp. 5165-5167
    • Kar, S.1    Raychaudhuri, A.K.2
  • 9
    • 35949011715 scopus 로고
    • 1/f noise and other slow, nonexponential kinetics in condensed matter
    • B. Weissman, "1/f noise and other slow, nonexponential kinetics in condensed matter", Rev. Mod. Phys., 60, 537571 (1988)
    • (1988) Rev. Mod. Phys. , vol.60 , pp. 537571
    • Weissman, B.1
  • 10
    • 0008649375 scopus 로고
    • Low-frequency fluctuations in solids: 1/f noise
    • Dutta and P. M. Horn, "Low-frequency fluctuations in solids: 1/f noise", Rev. Mod. Phys. 53, 497516 (1981)
    • (1981) Rev. Mod. Phys. , vol.53 , pp. 497516
    • Dutta1    Horn, P.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.