Onset of long-range diffusion and exponent of 1/fα noise in metal films with electromigration damage

Applied Physics Letters

Volumn 81, Issue 27, 2002, Pages 5165-5167

  Kar, Swastik ^a   Raychaudhuri, A K ^a  

^a INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION IN SOLIDS; ELECTROMIGRATION; HIGH TEMPERATURE EFFECTS; SPECTRUM ANALYSIS; SPURIOUS SIGNAL NOISE;

ELECTROMIGRATION DAMAGES;

METALLIC FILMS;

EID: 0347926410     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1523155     Document Type: Article

References (14)

1. R. H. Koch, J. R. Lloyd, and J. Cronin, Phys. Rev. Lett. 55, 2487 (1985).
2. Z. Celik-Butler and M. Ye, Solid-State Electron. 35, 1209 (1992).
3. K. Dagge, W. Frank, A. Seeger, and H. Stoll, Appl. Phys. Lett. 68, 1198 (1996).
4. G. B. Alers, N. L. Beverly, and A. S. Oats, J. Appl. Phys. 79, 7596 (1996).
5. G. E. Biery, R. G. Smith, and P. J. Ficalora, Mater. Res. Soc. Symp. Proc. 309, 312 (1993).
6. P. Dutta and P. M. Horn, Rev. Mod. Phys. 53, 497 (1981).
7. M. B. Weissman, Rev. Mod. Phys. 60, 537 (1988).
8. B. K. Jones, Adv. Electron. Electron Phys. 87, 201 (1994).
9. B. Fourcade and A. M. S. Tremblay, Phys. Rev. B 34, 7802 (1986); A. M. S. Tremblay and B. Fourcade, Noise in Physical Systems and I/f fluctuations, edited by C. M. Van-Vliet (World Scientific, Singapore, 1987), p. 59.
10. B. Fourcade and A. M. S. Tremblay, Phys. Rev. B 34, 7802 (1986); A. M. S. Tremblay and B. Fourcade, Noise in Physical Systems and I/f fluctuations, edited by C. M. Van-Vliet (World Scientific, Singapore, 1987), p. 59.
11. J. H. Scofield, J. V. Mantese, and W. W. Webb, Phys. Rev. B 32, 736 (1985).
12. 3/2 term. When the diffusing species is removed the spectra restores the 1/f form.
13. J. H. Scofield, Rev. Sci. Instrum. 58, 985 (1987).
14. A. Ghosh, Ph.D. thesis, Indian Institute of Science, Bangalore, India, 2000.