Electrical characterization of the mutual influences between gas molecules and single-walled carbon nanotubes

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Volumn 4, Issue 4, 2008, Pages 432-436

  Liang, Chen Wei ^a   Sahakalkan, Serhat ^a   Roth, Siegmar ^a  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

Annealing; Carbon nanotubes; Charge transport; Quantum dots; Spintronics

Indexed keywords

ANNEALING; CHARGE TRANSFER; ELECTRIC RESISTANCE; MAGNETOELECTRONICS; MORPHOLOGY; SEMICONDUCTOR QUANTUM DOTS; TRANSMISSION ELECTRON MICROSCOPY; TRANSPORT PROPERTIES;

CURRENT INDUCED ANNEALING (CIA); ELECTRICAL CHARACTERIZATION; GAS MOLECULES; HIGH CURRENT ANNEALING;

SINGLE-WALLED CARBON NANOTUBES (SWCN);

CARBON NANOTUBE;

ARTICLE; CHEMISTRY; ELECTROCHEMISTRY; ELECTROMAGNETIC FIELD; GAS; IMPEDANCE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; RADIATION EXPOSURE;

ELECTRIC IMPEDANCE; ELECTROCHEMISTRY; ELECTROMAGNETIC FIELDS; GASES; MATERIALS TESTING; NANOTECHNOLOGY; NANOTUBES, CARBON;

EID: 43149084777     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.200700436     Document Type: Article

References (25)

1. S. J. Tans, M. H. Devoret, H. Dai, A. Thess, R. E. Smalley, L. J. Geerligs, C. Dekker, Nature 1997, 386, 474-477.
2. M. Bockrath, D. H. Cobden, J. Liu, A. G. Rinzler, R. E. Smalley, L. Balents, P. L. McEuen, Nature 1999, 397, 598-601.
3. S. Sapmaz, C. Meyer, P. Beliczynski, P. Jarillo-Herrero, L. P. Kouwenhoven, Nano Lett. 2006, 6, 1350-1355.
4. J.-P. Cleuziou, W. Wernsdorfer, V. Bouchiat, T. Ondarçuhu, M. Monthioux, Nature Nanotechnol. 2006, 1, 53-59.
5. K. Tsukagoshi, B. W. Alphenaar, H. Ago, Nature 1999, 401, 572-574.
6. J.-R. Kim, H. M. So, J.-J. Kim, J. Kim, Phys. Rev. B 2002, 66, 233401.
7. S. Sahoo, T. Kontos, J. Furer, C. Hoffmann, M. Gräber, A. Cottet, C. Schönenberger, Nature Phys. 2005, 1, 99-102.
8. B. Nagabhirava, T. Bansal, G. U. Sumanasekera, B. W. Alphenaara, L. Liu, Appl. Phys. Lett. 2006, 88, 023503.
9. O. Suekane, A. Nagataki, Y. Nakayama, Appl. Phys. Lett. 2006, 89, 183110.
10. J. Kong, N. R. Franklin, C. Zhou, M. G. Chapline, S. Peng, K. Cho, H. Dal, Science, 2000, 287, 622-625.
11. M. Burghard, G. Duesberg, G. Philipp, J. Muster, S. Roth, Adv. Mater. 1998, 10, 554-558.
12. E. Artukovic, M. Kaempgen, D. S. Hecht, S. Roth, G. Grüner, Nano Lett. 2005, 5, 757-760.
13. M. A. Meitl, Y. Zhou, A. Gaur, S. Jeon, M. L. Usrey, M. S. Strano, J. A. Rogers, Nano Lett. 2004, 4, 1643-1647.
14. Z. Yao, C. L. Kane, C. Dekker, Phys. Rev. Lett. 2000, 84, 2941.
15. J.-Y. Park, S. Rosenblatt, Y. Yaish, V. Sazonova, H. Üstünel, S. Braig, T. A. Arias, P. W. Brouwer, P. L. McEuen, Nano Lett. 2004, 4, 517-520.
16. E. Pop, D. Mann, J. Cao, Q. Wang, K. Goodson, H. Dai, Phys. Rev. Lett. 2005, 95, 155505.
17. G. U. Sumanasekera, C. K. W. Adu, S. Fang, P. C. Eklund, Phys. Rev. Lett. 2000, 85, 1096.
18. W. Kim, A. Javey, O. Vermesh, Q. Wang, Y. Li, H. Dai, Nano Lett. 2003, 3, 193-198.
19. Y.-F. Chen, M. S. Fuhrer, Nano Lett. 2006, 6, 2158-2162.
20. W. Liang, M. Bockrath, H. Park, Phys. Rev. Lett. 2002, 88, 126801.
21. J. Cao, Q. Wang, H. Dal, Nature Mater. 2005, 4, 745-749.
22. N. Mason, M. J. Biercuk, C. M. Marcus, Science 2004, 303, 655-658.
23. W. Liang, M. Bockrath, D. Bozovic, J. H. Hafner, M. Tinkham, H. Park, Nature 2001, 411, 665-669.
24. J. Zhao, A. Buldum, J. Han, J. P. Lu, Nanotechnoiogy 2002, 13, 195-200.
25. M. Lazzeri, S. Piscanec, F. Mauri, A. C. Ferrari, J. Robertson, Phys. Rev. Lett. 2005, 95, 236802.