Excited state spectroscopy in carbon nanotube double quantum dots

Nano Letters

Volumn 6, Issue 7, 2006, Pages 1350-1355

  Sapmaz, Sami ^a   Meyer, Carola ^a,b   Beliczynski, Piotr ^a   Jarillo Herrero, Pablo ^a   Kouwenhoven, Leo P ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COUPLINGS; ELECTRON SPECTROSCOPY; FABRICATION; MEASUREMENT THEORY; SEMICONDUCTOR QUANTUM DOTS; THERMAL EFFECTS;

INELASTIC TRANSPORT SPECTROSCOPY; SHELL FILLING; SINGLE DOTS; TOP-GATES;

CARBON NANOTUBES;

CARBON NANOTUBE; QUANTUM DOT;

ARTICLE; ATOMIC FORCE MICROSCOPY; METHODOLOGY; SPECTROSCOPY;

MICROSCOPY, ATOMIC FORCE; NANOTUBES, CARBON; QUANTUM DOTS; SPECTRUM ANALYSIS;

EID: 33746862933     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl052498e     Document Type: Article

References (32)

1. Loss, D.; DiVincenzo, D. P. Phys. Rev. A 1998, 57, 120.
2. Elzerman, J. M.; Hanson, R.; Willems van Beveren, L. H.; Witkamp, B.; Vandersypen, L. M. K.; Kouwenhoven, L. P. Nature 2004, 430, 431.
3. Petta, J. R.; Johnson, A. C. ; Taylor, J. M.; Laird, E. A.; Yacoby, A.; Lukin, M. D.; Marcus, C. M.; Hanson, M. P.; Gossard, A. C. Science 2005, 309, 2180.
4. Koppens, F. H. L.; Folk, J. A.; Elzerman, J. M.; Hanson, R.; Willems van Beveren, L. H.; Vink, I. T.; Tranitz, H. P.; Wegscheider, W.; Kouwenhoven, L. P.; Vandersypen, L. M. K. Science 2005, 309, 1346.
5. Erlingsson, S. I.; Nazarov, Yu. V. Phys. Rev. B 2002, 66, 155327.
6. Khaetskii, A. V.; Nazarov, Yu. V. Phys. Rev. B 2000, 61, 12639.
7. Woods, L. M.; Reinecke, T. L.; Lyanda-Geller, Y. Phys. Rev. B 2002, 66, 161318.
8. Golovach, V. N.; Khaetskii, A.; Loss, D. Phys. Rev. Lett. 2004, 93, 016601.
9. Mason, N.; Biercuk, M. J.; Marcus, C. M. Science 2004, 303, 605.
10. Biercuk, M. J.; Garaj, S.; Mason, N.; Chow, J. M.; Marcus, C. M. Nemo Lett. 2005, 5, 1267.
11. Kong, J.; Soh, H. T.; Cassell, A. M.; Quate, C. F.; Dai, H. Nature 1998, 395, 878.
12. Javey, A.; Guo, J.; Wang, Q.; Lundstrom, M.; Dai, H. J. Nature 2003, 424, 654.
13. Mann, D.; Javey, A.; Kong, J.; Wang, Q.; Dai, H. J. Nano Lett. 2003, 1541.
14. Liang, W.; Bockrath, M.; Bozovic, D.; Hafner, J. H.; Tinkham, M.; Park, H. Nature 2001, 411, 665.
15. Lemay, S. G.; Janssen, J. W.; van den Hout, M.; Mooij, M.; Bronikowski, J. M.; Willis, P. A.; Smalley, R. E.; Kouwenhoven, L. P.; Dekker: C. Nature 2001, 412, 617.
16. Liang, W.; Bockrath, M.; Park, H. Phys. Rev. Lett. 2002, 88, 126801.
17. Sapmaz, S.; Jarillo-Herrero, P.; Kong, J.; Dekker: C.; Kouwenhoven, L.; van der Zand, H. Phys. Rev. B 2005, 71, 153402.
18. Moriyama, S.; Fuse, T.; Suzuki, M.; Aoyagi, Y.; Ishibashi, K. Phys. Rev. Lett. 2005, 94, 186806.
19. Babic, B.; Kontos, T.; Schönenberger, C. Phys. Rev. B 2004, 70, 235419.
20. Oreg, Y.; Byczuk, K.; Halperin, I. P. Phys. Rev. Lett. 2000, 85, 365.
21. De Franceschi, S.; Sasaki, S.; Elzerman, J. M.; van der Wiel, W. G.; Tarucha, S.; Kouwenhoven, L. P. Phys. Rev. Lett. 2001, 86, 878.
22. The asymmetric placement of the top-gates on the nanotube with respect to the source and drain electrodes (see Figure 1 caption) may explain the different charging energy for the left and right dot.
23. Johnson, A. T.; Kouwenhoven, L. P.; de Jong, W.; van der Vaart, N. C.; Harmans, C. J. P. M.; Foxon, C. T. Phys. Rev. Lett. 1992, 69, 1592.
24. Weis, J.; Haug, R. J.; von Klitzing, K.; Ploog, K. Phys. Rev. Lett. 1993, 71, 4019.
25. Nakashima, H.; Uosurai, K. Jpn. J. Appl. Phys. 1995, 34, L1659.
26. Evans, G. J.; Mizuta, H. J. Appl. Phys. 2002, 92, 3124.
27. van der Wiel, W. G.; De Franceschi, S.; Elzerman, J. M.; Fujisawa, T.; Tarucha, S.; Kouwenhoven, L. P. Rev. Mod. Phys. 2003, 75, 1.
28. We know that the measurements are taken in the p-type region of the CNT, because the barriers become more open with smaller voltage applied (not shown here).
29. Fujisawa, T.; Oosterkamp, T. H.; van der Wiel, W. G.; Broer, W.; Aguado, R.; Tarucha, S.; Kouwenhoven, L. P. Science 1998, 282, 932.
30. Sapmaz, S.; Jarillo-Herrero, P.; Blanter, Ya. M.; Dekker: C.; van der Zant H. S. J. Phys. Rev. Lett. 2006, 96, 026801.
31. Fujisawa, T.; Tokura, Y.; Hirayama, Y. Phys. Rev. B 2001, 63, 081304.
32. Hanson, R.; Willems van Beveren, L. H.; Vink, I. T.; Elzerman, J. M.; Naber, W. J. M.; Koppens, F. H. L.; Kouwenhoven, L. P.; Vandersypen, L. M. K. Phys. Rev. Lett. 2005, 94, 196802.