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Volumn 266, Issue 8, 2008, Pages 1216-1223
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Structural changes in helium implanted Zr0.8Y0.2O1.9 single crystals characterized by atomic force microscopy and EXAFS spectroscopy
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Author keywords
Helium implantations; Point defects; Stabilized zirconia
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;
HELIUM;
MATHEMATICAL MODELS;
POINT DEFECTS;
ZIRCONIA;
ATOMIC SCALE STRUCTURAL MODIFICATIONS;
HELIUM IMPLANTATIONS;
LATTICE VACANCIES;
STABILIZED ZIRCONIA;
SINGLE CRYSTALS;
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EID: 43149083257
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2008.02.020 Document Type: Article |
Times cited : (11)
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References (25)
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