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Volumn 266, Issue 8, 2008, Pages 1216-1223

Structural changes in helium implanted Zr0.8Y0.2O1.9 single crystals characterized by atomic force microscopy and EXAFS spectroscopy

Author keywords

Helium implantations; Point defects; Stabilized zirconia

Indexed keywords

ATOMIC FORCE MICROSCOPY; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; HELIUM; MATHEMATICAL MODELS; POINT DEFECTS; ZIRCONIA;

EID: 43149083257     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2008.02.020     Document Type: Article
Times cited : (11)

References (25)
  • 6
    • 43149088998 scopus 로고    scopus 로고
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.