No-fault-found and intermittent failures in electronic products

Microelectronics Reliability

Volumn 48, Issue 5, 2008, Pages 663-674

  Qi, Haiyu ^a   Ganesan, Sanka ^a   Pecht, Michael ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER HARDWARE; FAILURE ANALYSIS;

ELECTRONIC PRODUCTS; INTERMITTENT FAILURES;

ELECTRONIC EQUIPMENT;

EID: 43049154693     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2008.02.003     Document Type: Review

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