Layered critical values: A powerful direct-adjustment approach to discovering significant patterns

Machine Learning

Volumn 71, Issue 2-3, 2008, Pages 307-323

  Webb, Geoffrey I ^a  

^a MONASH UNIVERSITY   (Australia)

Author keywords

Association rules; Layered critical values; Pattern discovery; Significant patterns; Significant rules; Statistical procedures

Indexed keywords

ASSOCIATION RULES; DATA MINING; PROBLEM SOLVING; STATISTICAL METHODS;

LAYERED CRITICAL VALUES; PATTERN DISCOVERY; STATISTICAL PROCEDURES;

PATTERN RECOGNITION;

EID: 43049129165     PISSN: 08856125     EISSN: 15730565     Source Type: Journal    
DOI: 10.1007/s10994-008-5046-x     Document Type: Article

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