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Volumn 354, Issue 19-25, 2008, Pages 2421-2425
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Advanced optical characterization of disordered semiconductors by Fourier transform photocurrent spectroscopy
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Author keywords
Absorption; Band structure; Defects; FTIR measurements; Monte Carlo simulations; Optical spectroscopy; Photoconductivity; Photovoltaics; Plasma deposition; Silicon; Solar cells; Structure
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Indexed keywords
ABSORPTION;
BAND STRUCTURE;
COMPUTER SIMULATION;
EMISSION SPECTROSCOPY;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
MONTE CARLO METHODS;
PHOTOCONDUCTIVITY;
PHOTOELECTRIC CELLS;
PLASMA DEPOSITION;
SILICON COMPOUNDS;
SOLAR CELLS;
ULTRAVIOLET VISIBLE SPECTROSCOPY;
FTIR MEASUREMENTS;
PHOTOVOLTAICS;
SEMICONDUCTOR MATERIALS;
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EID: 43049139177
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2007.09.108 Document Type: Article |
Times cited : (5)
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References (12)
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