-
1
-
-
0032025112
-
Stylus contact method for surface metrology in the ascendancy
-
Whitehouse D.J. Stylus contact method for surface metrology in the ascendancy. Meas Cont 31 2 (1998) 48-50
-
(1998)
Meas Cont
, vol.31
, Issue.2
, pp. 48-50
-
-
Whitehouse, D.J.1
-
3
-
-
0020183371
-
Optical profiler. A new method for high sensitivity and wide dynamic range
-
Lenz F.Y., and Shamir J. Optical profiler. A new method for high sensitivity and wide dynamic range. J Appl Opt 21 (1982) 3200-3208
-
(1982)
J Appl Opt
, vol.21
, pp. 3200-3208
-
-
Lenz, F.Y.1
Shamir, J.2
-
4
-
-
0027654624
-
Effects of finite stylus width in surface contact profilometry
-
O'Donell K.A. Effects of finite stylus width in surface contact profilometry. J Appl Opt 25 (1993) 4922-4928
-
(1993)
J Appl Opt
, vol.25
, pp. 4922-4928
-
-
O'Donell, K.A.1
-
6
-
-
0026985004
-
Real time measurement of surface roughness on ground surfaces using speckle-contrast technique
-
Persson U. Real time measurement of surface roughness on ground surfaces using speckle-contrast technique. Opt Laser Eng 17 (1992) 61-67
-
(1992)
Opt Laser Eng
, vol.17
, pp. 61-67
-
-
Persson, U.1
-
7
-
-
0027539466
-
Measurement of surface roughness on rough machined surface using speckle correlation and image analysis
-
Persson U. Measurement of surface roughness on rough machined surface using speckle correlation and image analysis. Wear 160 (1993) 221-225
-
(1993)
Wear
, vol.160
, pp. 221-225
-
-
Persson, U.1
-
8
-
-
84975558652
-
Application of speckle-correlation methods to surface roughness measurement: a theoretical study
-
Ruffung B. Application of speckle-correlation methods to surface roughness measurement: a theoretical study. J Opt Soc Am A3 (1986) 1297-1304
-
(1986)
J Opt Soc Am
, vol.A3
, pp. 1297-1304
-
-
Ruffung, B.1
-
9
-
-
84975633735
-
Whole field determination of surface roughness by speckle correlation
-
Tay C.J., Toh S.L., Shang H.M., and Zhang J.B. Whole field determination of surface roughness by speckle correlation. J Appl Opt 34 (1995) 2324-2335
-
(1995)
J Appl Opt
, vol.34
, pp. 2324-2335
-
-
Tay, C.J.1
Toh, S.L.2
Shang, H.M.3
Zhang, J.B.4
-
10
-
-
77956962463
-
The scattering of light by rough surfaces
-
Beckmann P. The scattering of light by rough surfaces. Prog Opt 6 (1967) 53-68
-
(1967)
Prog Opt
, vol.6
, pp. 53-68
-
-
Beckmann, P.1
-
11
-
-
0000147672
-
Measurement of surface roughness properties by using image speckle contrast
-
Fujii H., Asakura T., and Shindo Y. Measurement of surface roughness properties by using image speckle contrast. J Opt Soc Am 66 (1976) 1217-1221
-
(1976)
J Opt Soc Am
, vol.66
, pp. 1217-1221
-
-
Fujii, H.1
Asakura, T.2
Shindo, Y.3
-
12
-
-
0015361148
-
Quantitative visualization of large variation phase objects
-
Sprague R.A., and Thompson B.J. Quantitative visualization of large variation phase objects. J Appl Opt 11 (1972) 1469-1479
-
(1972)
J Appl Opt
, vol.11
, pp. 1469-1479
-
-
Sprague, R.A.1
Thompson, B.J.2
-
13
-
-
84975654648
-
Surface roughness dependence of the intensity correlation function under speckle pattern illumination
-
Yoshimura T., Kato K., and Nakagawa K. Surface roughness dependence of the intensity correlation function under speckle pattern illumination. J Opt Soc Am 7 (1990) 2254
-
(1990)
J Opt Soc Am
, vol.7
, pp. 2254
-
-
Yoshimura, T.1
Kato, K.2
Nakagawa, K.3
-
16
-
-
0018441820
-
Vector scattering theory
-
Elson J.M., and Bennett J.M. Vector scattering theory. J Opt Eng 18 (1979) 116-124
-
(1979)
J Opt Eng
, vol.18
, pp. 116-124
-
-
Elson, J.M.1
Bennett, J.M.2
-
17
-
-
0030156933
-
Measurement of surface roughness using infrared scattering
-
Persson U. Measurement of surface roughness using infrared scattering. Measurement 18 (1996) 109-116
-
(1996)
Measurement
, vol.18
, pp. 109-116
-
-
Persson, U.1
-
18
-
-
42949091434
-
-
Wang SH, Quan C, Tay CJ, Shang HM. Surface roughness measurement in the submicrometer range using later scattering 2000;39:1591-1601.
-
Wang SH, Quan C, Tay CJ, Shang HM. Surface roughness measurement in the submicrometer range using later scattering 2000;39:1591-1601.
-
-
-
-
22
-
-
42949089934
-
-
ISO 4288:1996, Geometrical product specification (GPS)-surface texture: profile method-terms definitions and surface texture parameters, Inst. Std. Org., Geneva.
-
ISO 4288:1996, Geometrical product specification (GPS)-surface texture: profile method-terms definitions and surface texture parameters, Inst. Std. Org., Geneva.
-
-
-
-
23
-
-
0024944875
-
Measurement of surface roughness by a machine vision
-
Luk F., Huynh V., and North W. Measurement of surface roughness by a machine vision. J Phys E Sci Instrum 22 (1989) 977-980
-
(1989)
J Phys E Sci Instrum
, vol.22
, pp. 977-980
-
-
Luk, F.1
Huynh, V.2
North, W.3
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