Measurement of surface roughness using infrared scattering

Measurement: Journal of the International Measurement Confederation

Volumn 18, Issue 2, 1996, Pages 109-116

  Persson, U ^a  

^a MID SWEDEN UNIVERSITY   (Sweden)

Author keywords

Infrared scattering; Surface roughness; Surface topography

Indexed keywords

GEOMETRICAL OPTICS; INDUSTRIAL APPLICATIONS; INFRARED RADIATION; LIGHT SCATTERING; SPECKLE; SURFACE MEASUREMENT; SURFACE ROUGHNESS;

INFRARED SCATTERING; NONCONTACT MEASUREMENT; STYLUS INSTRUMENT; SURFACE TOPOGRAPHY;

ROUGHNESS MEASUREMENT;

EID: 0030156933     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0263-2241(96)00047-4     Document Type: Article

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