A fast ramp rate thermally stimulated current technique to quantify electronic charge dynamics in thin films

Review of Scientific Instruments

Volumn 79, Issue 4, 2008, Pages

  Lew, Connie ^a   Thompson, Michael O ^a  

^a Cornell University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CHARGE; ELECTRIC CURRENTS; MEASUREMENT THEORY; THERMAL EFFECTS;

ELECTRONIC CHARGE DYNAMICS; TEMPERATURE RAMP RATES; THERMALLY STIMULATED CURRENT (TSC) TECHNIQUES;

FERROELECTRIC THIN FILMS;

EID: 42949096546     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2917183     Document Type: Article

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