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Volumn 70, Issue 20, 2004, Pages

Parity measurement of one- and two-electron double well systems

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ELECTRICITY; ELECTRON; MATHEMATICAL ANALYSIS; PARITY; SENSITIVITY ANALYSIS;

EID: 42749108329     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.70.205342     Document Type: Article
Times cited : (15)

References (23)
  • 12
    • 12744255978 scopus 로고    scopus 로고
    • S. D. Barrett and T. M. Stace, cond-mat/0411581
    • S. D. Barrett and T. M. Stace, cond-mat/0411581.
  • 20
    • 12744258598 scopus 로고    scopus 로고
    • R. Sridhar and R. Jagannathan, math-ph/0212068
    • R. Sridhar and R. Jagannathan, math-ph/0212068.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.