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Volumn 69, Issue 15, 2004, Pages
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Ultrathin Ni layers grown epitaxially on SiC(0001) at room temperature
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Author keywords
[No Author keywords available]
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Indexed keywords
CARBON;
NICKEL;
SILICON DERIVATIVE;
ARTICLE;
ATOM;
CRYSTALLIZATION;
ELECTRON;
ELECTRON DIFFRACTION;
LIGHT;
ROOM TEMPERATURE;
SYNCHROTRON;
THICKNESS;
X RAY PHOTOELECTRON SPECTROSCOPY;
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EID: 42749106618
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevB.69.155303 Document Type: Article |
Times cited : (7)
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References (18)
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