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Volumn 69, Issue 18, 2004, Pages
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Single-shot measurement of the Josephson charge qubit
b
NEC CORPORATION
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
ARTICLE;
CALCULATION;
CONFORMATIONAL TRANSITION;
DYNAMICS;
ELECTRIC POTENTIAL;
ELECTRON;
MEASUREMENT;
PARAMETER;
QUANTUM MECHANICS;
SCANNING ELECTRON MICROSCOPY;
SUPERCONDUCTOR;
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EID: 42749099201
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevB.69.180507 Document Type: Article |
Times cited : (86)
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References (20)
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