Single-shot reflection Z-scan for measurements of the nonlinear refraction of nontransparent materials

Applied Physics B: Lasers and Optics

Volumn 91, Issue 2, 2008, Pages 273-277

  Ganeev, R A ^a,b  

^a UNIVERSITY OF TOKYO   (Japan)

^b S YU YUNUSOV INSTITUTE OF THE CHEMISTRY OF PLANT SUBSTANCES   (Uzbekistan)

Author keywords

[No Author keywords available]

Indexed keywords

LENSES; LIGHT REFLECTION; REFRACTIVE INDEX; SEMICONDUCTING GALLIUM ARSENIDE; TRANSPARENCY;

NONLINEAR REFRACTIVE INDICES; NONTRANSPARENT MATERIALS; SINGLE SHOT REFLECTION Z-SCAN;

LIGHT REFRACTION;

EID: 42649097572     PISSN: 09462171     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00340-008-2951-4     Document Type: Article

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