Optical characteristics of semiconductor saturable absorber mirrors investigated by the reflection Z-scan technique

Optics Communications

Volumn 265, Issue 2, 2006, Pages 369-372

  Wang, Kai ^a   Xing, Qi rong ^a   Li, Huan yu ^a   Li, Jian ping ^a   Zhang, Zhi gang ^a   Zhang, Ning ^a   Chai, Lu ^a   Wang, Qing yue ^a  

^a TIANJIN UNIVERSITY   (China)

Author keywords

Modulation depth; Saturation fluence; SESAM; Z Scan

Indexed keywords

LASER MODE LOCKING; LIGHT REFLECTION; MODULATION; OPTICAL PROPERTIES; SEMICONDUCTOR MATERIALS; SOLID STATE LASERS;

MODULATION DEPTH; SATURATION FLUENCE; SEMICONDUCTOR SATURABLE ABSORBER MIRROR (SESAM); Z-SCAN TECHNIQUE;

MIRRORS;

EID: 33748031446     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2006.03.022     Document Type: Article

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