Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam

Applied Physics Letters

Volumn 72, Issue 12, 1998, Pages 1427-1429

  Martinelli, M ^a   Bian, S ^a   Leite, J R ^a   Horowicz, R J ^a  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE MEASUREMENT; APPROXIMATION THEORY; CALCULATIONS; LASER BEAM EFFECTS; LIGHT POLARIZATION; LIGHT REFLECTION; MATHEMATICAL MODELS; NONLINEAR OPTICS; OPTICAL VARIABLES MEASUREMENT; PHOTOSENSITIVITY;

BREWSTER ANGLE; OBLIQUE INCIDENCE; Z SCAN TECHNIQUE;

REFRACTIVE INDEX;

EID: 0032024545     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120584     Document Type: Article

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