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Physica Status Solidi (A) Applications and Materials Science

Volumn 202, Issue 1, 2005, Pages 120-125

Reflection z-scan measurements of opaque semiconductor thin films

(2) Ganeev, R A a,b Ryasnyansky, A I c,d

a ARIFOV INSTITUTE OF ELECTRONICS (Uzbekistan)

b UNIVERSITY OF TOKYO (Japan)

c INSTITUT DES NANOSCIENCES DE PARIS (France)

d SAMARKAND STATE UNIVERSITY (Uzbekistan)

Author keywords

[No Author keywords available]

Indexed keywords

NONLINEAR REFRACTION; SEMICONDUCTOR THIN FILMS; Z-SCAN MEASUREMENTS;

CADMIUM SULFIDE; PHASE TRANSITIONS; REFLECTION; REFRACTIVE INDEX; THIN FILMS;

SEMICONDUCTOR MATERIALS;

EID: 23844467698 PISSN: 18626300 EISSN: 18626319 Source Type: Journal
DOI: 10.1002/pssa.200406896 Document Type: Article

Times cited : (27)

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