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Volumn 354, Issue 19-25, 2008, Pages 2164-2166
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A study of absorption coefficient spectra in a-Si:H films near the transition from amorphous to crystalline phase measured by resonant photothermal bending spectroscopy
a
GIFU UNIVERSITY
(Japan)
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Author keywords
Silicon
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Indexed keywords
ABSORPTION SPECTRA;
LIGHT ABSORPTION;
PHASE MEASUREMENT;
PHASE TRANSITIONS;
PHOTONS;
THIN FILMS;
CRYSTALLINE PHASE;
LIGHT ILLUMINATION;
THERMAL ANNEALING;
AMORPHOUS SILICON;
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EID: 42649092847
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2007.10.039 Document Type: Article |
Times cited : (10)
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References (7)
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