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Volumn , Issue , 2007, Pages 549-553

Cavity-through deep reactive ion etching of directly-bonded silicon wafers

Author keywords

Deep reactive ion etching (DRIE); Direct bonding; Multilayer MEMS; Plasma treatment

Indexed keywords

ACTUATORS; ELECTRON BEAM LITHOGRAPHY; ETCHING; MICROSYSTEMS; NONMETALS; PULSED LASER DEPOSITION; REACTIVE ION ETCHING; SENSORS; SILICON; TRANSDUCERS; WAFER BONDING;

EID: 42549125168     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SENSOR.2007.4300189     Document Type: Conference Paper
Times cited : (5)

References (8)
  • 3
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    • Void-free silicon-wafer-bond strengthening in the 200-400 °C range
    • Gudrun Kissinger, Wolfgang Kissinger, Void-free silicon-wafer-bond strengthening in the 200-400 °C range, Sensors & Actuators A, 36 (1993) pp. 149-156.
    • (1993) Sensors & Actuators A , vol.36 , pp. 149-156
    • Kissinger, G.1    Kissinger, W.2
  • 4
    • 0027593469 scopus 로고
    • Application of oxygen plasma processing to silicon direct bonding
    • O. Zucker et al., Application of oxygen plasma processing to silicon direct bonding, Sensors & Actuators A, 36 (1993) pp. 227-231.
    • (1993) Sensors & Actuators A , vol.36 , pp. 227-231
    • Zucker, O.1
  • 5
    • 0029406140 scopus 로고
    • Chemical Free Room Temperature Wafer To Wafer Direct Bonding
    • Shari N. Farrens et al., Chemical Free Room Temperature Wafer To Wafer Direct Bonding, J. Electrochem. Soc., 142 (1995) pp. 3949-3955.
    • (1995) J. Electrochem. Soc , vol.142 , pp. 3949-3955
    • Farrens, S.N.1
  • 6
    • 0034230070 scopus 로고    scopus 로고
    • 2-Plasma-Treated Silicon (100) Surfaces
    • 2-Plasma-Treated Silicon (100) Surfaces, J. Electrochem. Soc., 147 (2000) pp. 2734-2740.
    • (2000) J. Electrochem. Soc , vol.147 , pp. 2734-2740
    • Wiegand, M.1
  • 7
    • 18844433542 scopus 로고    scopus 로고
    • Xuan Xiong Zhang, Jean-Pierre Raskin, Low-Temperature Wafer Bonding: A Study of Void Formation and Influence on Bonding Strength, J. Microelectromech. Syst., 14 (2005) pp. 368-382.
    • Xuan Xiong Zhang, Jean-Pierre Raskin, Low-Temperature Wafer Bonding: A Study of Void Formation and Influence on Bonding Strength, J. Microelectromech. Syst., 14 (2005) pp. 368-382.
  • 8
    • 0037438778 scopus 로고    scopus 로고
    • Multi-stack silicon-direct wafer bonding for 3D MEMS manufacturing
    • N. Miki et al., Multi-stack silicon-direct wafer bonding for 3D MEMS manufacturing, Sensors & Actuators A, 103 (2003) pp. 194-201.
    • (2003) Sensors & Actuators A , vol.103 , pp. 194-201
    • Miki, N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.