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Volumn , Issue , 2007, Pages 549-553
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Cavity-through deep reactive ion etching of directly-bonded silicon wafers
a
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Author keywords
Deep reactive ion etching (DRIE); Direct bonding; Multilayer MEMS; Plasma treatment
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Indexed keywords
ACTUATORS;
ELECTRON BEAM LITHOGRAPHY;
ETCHING;
MICROSYSTEMS;
NONMETALS;
PULSED LASER DEPOSITION;
REACTIVE ION ETCHING;
SENSORS;
SILICON;
TRANSDUCERS;
WAFER BONDING;
BOSCH PROCESSES;
DEEP REACTIVE ION ETCHING;
DEEP REACTIVE ION ETCHING (DRIE);
DIRECT BONDING;
INTERNATIONAL CONFERENCES;
MULTILAYER MEMS;
PLASMA TREATMENT;
SILICON-DIRECT-BONDING;
SOLID-STATE SENSORS;
SYSTEMATIC STUDY;
SILICON WAFERS;
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EID: 42549125168
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/SENSOR.2007.4300189 Document Type: Conference Paper |
Times cited : (5)
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References (8)
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