메뉴 건너뛰기




Volumn , Issue , 2006, Pages 389-392

Band to band tunneling limited off state current in ultra-thin body double gate FETs with high mobility materials: III-V, Ge and strained Si/Ge

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; ELECTRON TUNNELING; LEAKAGE CURRENTS; MATHEMATICAL MODELS; SPECIFICATIONS;

EID: 42549117204     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SISPAD.2006.282916     Document Type: Conference Paper
Times cited : (14)

References (10)
  • 2
    • 33745138556 scopus 로고    scopus 로고
    • Low defect ultra-thin fully strained-Ge MOSFET on relaxed Si with high mobility and low band-to-band-tunneling (BTBT)
    • T. Krishnamohan, Z. Krivokapic, K. Uchida, Y. Nishi, K.C. Saraswat, "Low defect ultra-thin fully strained-Ge MOSFET on relaxed Si with high mobility and low band-to-band-tunneling (BTBT)" Symposium on VLSI Technology, pp. 82-83, 2005.
    • (2005) Symposium on VLSI Technology , pp. 82-83
    • Krishnamohan, T.1    Krivokapic, Z.2    Uchida, K.3    Nishi, Y.4    Saraswat, K.C.5
  • 6
    • 0001038893 scopus 로고    scopus 로고
    • Band structure, deformation potentials, and carrier mobility in strained Si, Ge, and SiGe alloys
    • M.V. Fischetti, S.E. Laux, "Band structure, deformation potentials, and carrier mobility in strained Si, Ge, and SiGe alloys", Journal of Applied Physics, pp. 2234-2252, 1996.
    • (1996) Journal of Applied Physics , pp. 2234-2252
    • Fischetti, M.V.1    Laux, S.E.2
  • 7
    • 0026116329 scopus 로고
    • Monte Carlo Simulation of Transport in Technologically Significant Semiconductors of the Diamond and Zinc-Blende Structures - Part I: Homogeneous Transport
    • March
    • M.V. Fischetti, "Monte Carlo Simulation of Transport in Technologically Significant Semiconductors of the Diamond and Zinc-Blende Structures - Part I: Homogeneous Transport", IEEE Transactions on Electron Devices, vol. 38, No. 3, pp. 634-649, March 1991.
    • (1991) IEEE Transactions on Electron Devices , vol.38 , Issue.3 , pp. 634-649
    • Fischetti, M.V.1
  • 8
    • 42549141527 scopus 로고    scopus 로고
    • MINIMOS™
    • MINIMOS™
  • 9
    • 42549116514 scopus 로고    scopus 로고
    • TAURUS™
    • TAURUS™
  • 10
    • 42549086107 scopus 로고    scopus 로고
    • DESSIS™
    • DESSIS™


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.