Active and passive RF device compact modeling in CMOS technoloies

International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

Volumn , Issue , 2006, Pages 17-22

  Shin, Hyungcheol ^a   Kang, In Man ^a   Jeon, Jong Wook ^a   Gil, Joonho ^b  

^a Seoul National University   (South Korea)

^b RadioPulse Inc   (South Korea)

Author keywords

Analytical thermal noise modeling; Macro modeling; Non quasi static effect; RF MOSFET modeling; Substrate resistance; Three port measurement

Indexed keywords

ELECTRIC INDUCTORS; MOSFET DEVICES; SEMICONDUCTOR MATERIALS; THERMAL NOISE;

MACRO MODEL; THREE-PORT MEASUREMENT;

CMOS INTEGRATED CIRCUITS;

EID: 42549088704     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SISPAD.2006.282828     Document Type: Conference Paper

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