Characterization of surface oxide layers formed on Fe-Al alloys by annealing under different atmospheres

Surface and Interface Analysis

Volumn 40, Issue 3-4, 2008, Pages 311-314

  Suzuki, Shigeru ^a   Yamamoto, Takamichi ^a   Shinoda, Kozo ^a   Sato, Shigeo ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b NONE   (Japan)

Author keywords

Aluminum oxide; Depth profiling; Iron based alloy; Secondary ion mass spectrometry; X ray photoelectron spectroscopy

Indexed keywords

ANNEALING; IRON ALLOYS; OXYGEN; SECONDARY ION MASS SPECTROMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

ALUMINUM OXIDE; IRON BASED ALLOY;

OXIDES;

EID: 42449109040     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2635     Document Type: Conference Paper

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