SIMS/XPS characterization of surface layers formed in 3 mass% Si-steel by annealing in oxygen at low partial pressure

Surface and Interface Analysis

Volumn 35, Issue 3, 2003, Pages 276-281

  Suzuki, S ^a   Yanagihara, K ^b   Yamazaki, S ^b   Tanaka, K ^b   Waseda, Y ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b NONE

Author keywords

Depth profiling; Internal oxidation; Segregation; Selective oxidation; Silicon steel; SIMS; XPS

Indexed keywords

ANNEALING; INTERNAL OXIDATION; OXYGEN; PARTIAL PRESSURE; SILICON STEEL; THERMODYNAMICS; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE ORIENTATION;

SURFACE STRUCTURE;

EID: 0037341398     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1527     Document Type: Article

References (21)

1. Kofstad P. High Temperature Corrosion. Elsevier Applied Science: London, 1988; 324.
2. Douglass DL. Oxid. Met. 1995; 44: 81.
3. Rahamel A, Tobolski J. Werkst. Korros. 1965; 16: 662.
4. Tuck CW. Corros. Sci. 1965; 5: 631.
5. Logani RC, Smeltzer WW. Oxid. Met. 1971; 3: 15.
6. Kusabiraki K, Sugai T, Ooka T. Tetsu-to-Hagane 1991; 77: 123 (in Japanese).
7. Fukumoto M, Hayashi S, Maeda S, Narita T. Tetsu-to-Hagane 1999; 85: 16 (in Japanese).
8. Fukumoto M, Maeda S, Hayashi S, Narita T. Proceedings of High Temperature Corrosion and Protection 2000. ISIJ: Tokyo, 1999; 215.
9. Yamazaki T. Trans. ISIJ 1969; 9: 66.
10. Morito N, Ichida T. Corros. Sci. 1977; 17: 961.
11. Block W, Jayaman N. Mater. Sci. Tech. 1986; 2: 22.
12. Suzuki S, Yanagihara K, Yamazaki S. J. Surf. Anal. 1999; 5: 2745.
13. Yanagihara K, Suzuki S, Yamazaki S. Proceedings of High Temperature Corrosion and Protection 2000. ISIJ: Tokyo, 1999; 99.
14. Yanagihara K, Suzuki S, Yamazaki S. Oxid. Met. 2002; 57: 281.
15. Yanagihara K, Suzuki S, Yamazaki S. J. Surf. Anal. 2002; 9: 388.
16. Suzuki S, Ushigami Y, Homma H, Takebayashi S, Kubota T. Mater. Trans. 2001; 42: 994.
17. Gao T, Marie Y, Saldi F, Migeon H-N. Int. J. Mass Spectrom. Ion Process. 1995; 143: 11.
18. Moudler JF, Sticle WF, Sobol PE, Bomben K. X-ray Photoelectron Spectroscopy. Physical Electronics: Eden Prairie, MM, 1993; 213.
19. Suzuki S, Kosaka T, Inoue H, Isshiki M, Waseda Y. Appl. Surf. Sci. 1996; 103: 495.
20. Suzuki S, Ishikawa Y, Isshiki M, Waseda Y. Mater. Trans. J. Inst. Met. 1997; 38: 1004.
21. Suzuki S. Mater. Trans. J. Inst. Met. 1994; 35: 35.