SIMS/XPS studies of surface layer formed in Fe-Si-Mn alloys by oxygen penetration

ISIJ International

Volumn 43, Issue 1, 2003, Pages 71-76

  Suzuki, Shigeru ^a   Hasegawa, Haijme ^a   Mizoguchi, Shozo ^a   Waseda, Yoshio ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Iron silicon manganese alloys; Oxidation; Secondary ion mass spectrometry; X ray photoelectron spectroscopy

Indexed keywords

ANNEALING; ARGON; HYDROGEN; MORPHOLOGY; OXIDATION; PARTIAL PRESSURE; SECONDARY ION MASS SPECTROMETRY; SILICA; SILICON; X RAY PHOTOELECTRON SPECTROSCOPY;

OXYGEN PENETRATION; SILICON CONCENTRATION; SURFACE CONCENTRATION; SURFACE LAYER;

IRON ALLOYS;

EID: 0037226292     PISSN: 09151559     EISSN: None     Source Type: Journal    
DOI: 10.2355/isijinternational.43.71     Document Type: Article

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