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Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

Spin polarization in near-field opticalmicroscopy

(1) Kobayashi, K a

a IBM JAPAN LTD (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DENSITY OPERATORS; DETECTION SCHEME; LINEAR POLARIZATION; NANOMETRICS; NEAR FIELD OPTICAL MICROSCOPY; NEAR-FIELD; PEAK INTENSITY; PEAK SHIFT; PROBE BEAM; PROPAGATOR METHOD; SAMPLE SYSTEM; STRONG COUPLING; TIP-SAMPLE DISTANCE;

OPTICAL MICROSCOPY; PROBES; SPIN POLARIZATION;

SPIN DYNAMICS;

EID: 4243643996 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s003390051170 Document Type: Article

Times cited : (4)

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