Polarization-dependent contrast in near-field optical microscopy

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 15, Issue 6, 1997, Pages 1966-1970

  Kobayashi, Kiyoshi ^a   Watanuki, Osaaki ^b  

^a IBM JAPAN LTD   (Japan)

^b SENSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; COMPUTER SIMULATION; MATHEMATICAL MODELS; NUMERICAL METHODS; PERTURBATION TECHNIQUES; SCANNING TUNNELING MICROSCOPY;

PHOTON SCANNING TUNNELING MICROSCOPY; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

OPTICAL MICROSCOPY;

EID: 0031273607     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589586     Document Type: Article

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