Characteristics of photon scanning tunneling microscope read-out

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 804-808

  Kobayashi, Kiyoshi ^a   Watanuki, Osaaki ^a,b  

^a IBM JAPAN LTD   (Japan)

^b SENSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005260803     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588717     Document Type: Article

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