Three-wave X-ray diffraction: An analysis scheme of the sensitivity in determining triplet phase invariants

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 55, Issue 4, 1999, Pages 683-694

  Stetsko, Yuri P ^a,c   Chang, Shih Lin ^a,b  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

^c CHERNIVTSI NATIONAL UNIVERSITY   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243412847     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767398017838     Document Type: Article

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