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Volumn 80, Issue 2, 1998, Pages 301-304

Three-Wave Resonance Grazing Incidence X-Ray Diffraction: A Novel Method for Direct Phase Determination of Surface In-Plane Reflections

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EID: 0000740975     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.80.301     Document Type: Article
Times cited : (22)

References (25)
  • 13
    • 11744300811 scopus 로고
    • AK. Hümmer, E. Weckert, H. Bondza
    • Acta Crystallogr. Sect. AK. Hümmer, E. Weckert, H. Bondza 46, 393 (1990)
    • (1990) Acta Crystallogr. Sect. , vol.46 , pp. 393
  • 14
    • 85035288060 scopus 로고
    • AK. Hümmer, E. Weckert, H. Bondza
    • Acta Crystallogr. Sect. AK. Hümmer, E. Weckert, H. Bondza 47, 60 (1991).
    • (1991) Acta Crystallogr. Sect , vol.47 , pp. 60
  • 18
    • 0004919133 scopus 로고
    • references therein
    • S. Dietrich and A. Haase: Phys. Rep.260, 1 (1995), and references therein.
    • (1995) Phys. Rep , vol.260 , pp. 1
    • Dietrich, S.1    Haase, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.