Three-wave grazing-incidence X-ray diffraction from thin crystal surface layers: Determination of triplet phase invariants

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 55, Issue 3, 1999, Pages 457-465

  Stetsko, Yuri P ^a   Chang, Shih Lin ^b,c  

^a CHERNIVTSI NATIONAL UNIVERSITY   (Ukraine)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^c NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243434143     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767398012185     Document Type: Article

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