Multiple-Beam X-ray Diffraction for Physical Determination of Reflection Phases and its Applications

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 53, Issue 2, 1997, Pages 108-143

  Weckert, Edgar ^a   Hümmer, Kurt ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000184916     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767396011117     Document Type: Article

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