In situ dynamic measurements of sol-gel processed thin chemically selective PDMDAAC-silica films by spectroscopic ellipsometry

Chemistry of Materials

Volumn 16, Issue 17, 2004, Pages 3339-3347

  Zudans, Imants ^a   Heineman, William R ^a   Seliskar, Carl J ^a  

^a UNIVERSITY OF CINCINNATI   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL SENSORS; ELECTROCHEMISTRY; ELECTROLYTES; ELLIPSOMETRY; IN SITU PROCESSING; PHASE TRANSITIONS; REFRACTIVE INDEX; SOL-GELS;

COMPOSITE FILMS; FILM THICKNESS; INDIUM-TIN-OXIDES;

SILICA;

ELECTROLYTE; INDIUM; POTASSIUM NITRATE; SILICON DIOXIDE; TIN DERIVATIVE;

AQUEOUS SOLUTION; ARTICLE; ELECTROCHEMICAL ANALYSIS; ELLIPSOMETRY; FILM; HYDROGEL; MEASUREMENT; REFRACTION INDEX; SPECTROSCOPY;

EID: 4243100625     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm049709l     Document Type: Article

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