Influence of surface roughness on the semiconducting properties of oxide films formed on 304 stainless steel

Journal of Applied Electrochemistry

Volumn 38, Issue 5, 2008, Pages 679-687

  Hakiki, N E ^a  

^a UNIVERSITY OF ORAN   (Algeria)

Author keywords

AFM microscopy; Capacitance; Grit size; Impedance; Oxide films; Photocurrent; Surface roughness

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAPACITANCE; ELECTRIC IMPEDANCE; OXIDE FILMS; PHOTOCURRENTS; SURFACE ROUGHNESS;

GRIT SIZE; SEMICONDUCTING PROPERTIES;

STAINLESS STEEL;

EID: 42149138507     PISSN: 0021891X     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10800-008-9487-5     Document Type: Article

References (60)

1. MacDonald DD, Sikora E, Sikora J (1996) Electrochim Acta 41:783
2. Hakiki NE, Montemor MF, Ferreira MGS, Da Cunha Belo M (2000) Corros Sci 42:687
3. Montemor MF, Ferreira MGS, Hakiki NE, Da Cunha Belo M (2000) Corros Sci 42:1635
4. Da Cunha Belo M, Walls M, Hakiki NE, Corset J, Picquenard E, Sagon G, Nöel D (1998) Corros Sci 40:447
5. Da Cunha Belo M, Rondot B, Compere C, Montemor MF, Simöes AMP, Ferreira MGS (1998) Corros Sci 40:481
6. Hakiki NE, Boudin S, Rondot B, Da Cunha Belo M (1995) Corros Sci 37:1809
7. Di Paola A, Di Quarto F, Sunseri C (1986) Corros Sci 26:935
8. Ferreira MGS, Hakiki NE, Goodlet G, Faty S, Simöes AMP, Da Cunha Belo M (2001) Electrochim Acta 46:3767
9. Da Cunha Belo M, Hakiki NE, Ferreira MGS (1999) Electrochim Acta 44:2473
10. Simöes AMP, Ferreira MGS, Lorang G, Da Cunha Belo M (1991) Electrochim Acta 36:315
11. Di Paola A (1989) Electrochim Acta 34:203
12. Hakiki NE, Da Cunha Belo M, Simöes AMP, Ferreira MGS (1999) J Electrochem Soc 146:807
13. Hakiki NE, Da Cunha Belo M, Simöes AMP, Ferreira MGS (1998) J Electrochem Soc 145:3821
14. Schmuki P, Virtanen S, Isaacs HS, Ryan MP, Davenport AJ, Böhni H, Stenberg T (1998) J Electrochem Soc 145:791
15. Hakiki NE, Da Cunha Belo M (1996) J Electrochem Soc 143:3088
16. Schmuki P, Bohni H (1992) J Eleclrochem Soc 139:1908
17. Simöes AMP, Ferreira MGS, Rondot B, Da Cunha Belo M (1990) J Electrochem Soc 137:82
18. Sunseri C, Piazza S, Di Quarto F (1990) J Electrochem Soc 137:2411
19. Schmuki P, Bohni H (1989) J Electrochem Soc 139:7
20. Sunseri C, Piazza S, Di Paola A, Di Quarto F (1987) J Electrochem Soc 134:2410
21. Hakiki NE, Da Cunha Belo M (1995) CR Acad Sci Paris 320(II):613
22. Hakiki NE, Da Cunha Belo M (1993) CR Acad Sci Paris 317(II):457
23. Delnick FM, Hackermann N (1979) J Electrochem Soc 126:732
24. Azumi K, Ohtsuka T, Sato N (1987) J Electrochem Soc 134:1352
25. Stimming U, Schultze JW (1976) Ber Bunsenges Phys Chem 8:129
26. Stimming U (1987) Langmuir 3:423
27. Dean MH, Stimming U (1987) J Electroanal Chem 228:135
28. Gillot B, Rousset A (1986) J Solid State Chem 65:322
29. Tapping RL, Davidson RD, McAlpine E, Lister DH (1986) Corros Sci 26:563
30. Lister DH, Davidson RD, McAlpine E (1986) Corros Sci 27:113
31. Robertson J (1991) Corros Sci 32:443
32. Kim YJ (1995) Corrosion 51:849
33. Schuster E, Neeb KH, Ahlanger W, Henkelmann R, Jarnstrom RTJ (1988) J Nucl Mater 152:1
34. Farrow RL, Benner RE (1983) Proc Electrochem Soc 83:190
35. Tjong SC (1983) Mater Res Bull 18:157
36. Fabis P, Heidersbach R, Brown C, Rockeh T (1981) Corrosion 37:700
37. Johnston C (1990) Vib Spectrosc 1:87
38. Oblonsky LJ, Devine TM (1995) Corros Sci 37:17
39. Derek J, Gardiner C, Littleton J, Bowden M (1988) Appl Spectrosc 42:15
40. Szklarska-Smialowska Z, Chou C, Kuo-Chin D, Xia Z, Zaizhu A (1991) Corros Sci 32:609
41. Xia Z, Lai WK, Szklarska-Smialowska Z (1991) Corrosion 47:173
42. Lorang G, Da Cunha Belo M, Simões AMP, Ferreira MGS (1994) J Electrochem Soc 141:3347
43. Simoes AMP, Ferreira MGS, Lorang G, Da Cunha Belo M (1991) Electrochim Acta 36:315
44. Lovrecek B, Sefaja J (1972) Electrochim Acta 17:1151
45. Mahla E, Nielsen N (1948) J Electrochem Soc 93:1
46. Sukhotin AM, Grilikhes MS, Lisovaya EV (1989) Electrochim Acta 34:109
47. Young L (1955) Trans Farad Soc 51:1250
48. Sato N, Kudo K Noda T (1971) Electrochim Acta 16:1909
49. Sholt JA, Van Geel Ch (1953) Philips Rev Rep 8:47
50. Dutoit EC, Van Meirhaeghe RL, Cardon F, Gomes WP (1975) Ber Bensenges Phys Chem 79:1206
51. Van Meirhaeghe RL, Dutoit EC, Cardon F, Gomes WP (1975) Electrochim Acta 20: 995
52. Macdonald JR (1987) Impedance spectroscopy. Wiley, NY
53. Gärtner WW (1959) Phys Rev 116:84
54. Butler MA (1977) J Appl Phys 48:1914
55. Pankove JI (1975) Optical processes in semiconductors. Dover, NY
56. Bube RH (1967) Photoconductivity of solids. Wiley, NY
57. Hakiki NE, Simöes AMP, Ferreira MGS, Da Cunha Belo M (2000) Port Electrochim Acta 18:113
58. Montemor MF, Ferreira MGS, Hakiki NE, Da Cunha Belo M (1998) Mater Sci Forum 289:1139
59. Hakiki NE, Da Cunha Belo M (1995) CR Acad Sci Paris 320(II):463
60. Kennedy JH, Frese KW (1987) J Electrochem Soc 125:723