Effect of tip size on force measurement in atomic force microscopy

Langmuir

Volumn 24, Issue 6, 2008, Pages 2271-2273

  Lim, Leonard T W ^a   Wee, Andrew T S ^a   O'Shea, Sean J ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

GRAPHITE; SOLVATION;

OSCILLATORY SOLVATION FORCES;

ATOMIC FORCE MICROSCOPY;

EID: 42149129391     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la703231h     Document Type: Article

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