Differential aperture X-ray microscopy near Te precipitates in CdZnTe

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6706, Issue , 2007, Pages

  Miller, E A ^a   Toloczko, M ^a   Seifert, C E ^a   Seifert, A ^a   Liu, W ^b   Bliss, M ^b  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

CdZnTe; DAXM; Gamma detector; Precipitate; Strain; X ray diffraction; X ray microprobe

Indexed keywords

CRYSTAL GROWTH; DEFORMATION; MICROHARDNESS; OPTICAL RESOLVING POWER; SEMICONDUCTING TELLURIUM;

CDZNTE; DIFFERENTIAL APERTURE X-RAY MICROSCOPY (DAXM); MICROHARDNESS INDENT; WHITE-BEAM LAUE PATTERNS;

PRECIPITATES;

EID: 42149116883     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.738959     Document Type: Conference Paper

References (11)

1. F. Zhang, et al., "3-D position-sensitive CdZnTe spectrometer performance using third generation VAS/TAT readout electronics," IEEE Trans. Nucl. Sci. 52(5), 2009-2016 (2005).
2. P.N. Luke, et al., "Coplanar-grid CdZnTe detector with three-dimensional position sensitivity," Nucl. Inst, and Methods A 439 (2-3), 611-618 (2000).
3. M. Amman, et al., "Electron trapping nonuniformity in high-pressure Bridgman-grown CdZnTe," J. App. Phys. 92(6), 3198-3206 (2002).
4. S.A. Awadalla, et al., "Isoelectronic oxygen-related defect in CdTe crystals investigated using a thermoelectric effect spectroscopy," Phys. Rev. B 69, 075210 (2004).
5. P.N. Luke, et al., "Factors affecting energy resolution of coplanar-grid CdZnTe detectors," IEEE Trans. Nucl. Sci. 51(3), 1199-1203 (2004).
6. B.C. Larson, et al., "Three-dimensional X-ray structural microscopy with submicrometre resolution," Nature 415, 887-890 (2002).
7. The sample is from crystal growth 19, at the Center for Materials Research at Washington State University. CG-19 includes an excess of Te such that many precipitates are available for study, and is not of detector quality.
8. T.D. Rule, "Experimental Validation of (Cd, Zn)Te Crystal Growth Model", doctorial thesis, Washington State University, Pullman, WA (2002).
9. J.-S. Chung, "Automated indexing for texture and strain measurement with broad-bandpass x-ray microbeams," J. Appl. Phys. 86(9), 5249-5255 (1999).
10. A. Dal Corso, et al, "Nonlinear Piezoelectricity in CdTe," Phys. Rev. B 47(24), 16252-16256 (1993).
11. A.E. Bolotnikov, et al., "Cumulative effects of Te precipitates in CdZnTe radiation detectors," Nucl. Inst, and Methods A 571, 687-698 (2007).