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Volumn 589, Issue 2, 2008, Pages 250-258

A compact 7-cell Si-drift detector module for high-count rate X-ray spectroscopy

Author keywords

Silicon drift detector; Spectroscopic performance; X ray spectroscopy

Indexed keywords

AMPLIFICATION; AMPLIFIERS (ELECTRONIC); SENSORS; SPURIOUS SIGNAL NOISE; X RAY SPECTROSCOPY;

EID: 42049113635     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2008.02.010     Document Type: Article
Times cited : (11)

References (15)
  • 2
    • 42049095715 scopus 로고    scopus 로고
    • Bruker AXS, Inc., Madison WI, USA 〈www.bruker-axs.com〉.
    • Bruker AXS, Inc., Madison WI, USA 〈www.bruker-axs.com〉.
  • 9
    • 33947400592 scopus 로고    scopus 로고
    • E. Welter, K. Hansen, in: 13th International Conference on XAFS (XAFS13), Stanford, CA, USA, 2006; E. Welter, K. Hansen, in: Proceedings of the AIP XAFS13, vol. CP882, 2007, p. 917.
    • E. Welter, K. Hansen, in: 13th International Conference on XAFS (XAFS13), Stanford, CA, USA, 2006; E. Welter, K. Hansen, in: Proceedings of the AIP XAFS13, vol. CP882, 2007, p. 917.
  • 10
    • 44849087211 scopus 로고    scopus 로고
    • I. Diehl, K. Hansen, C. Reckleben, ESSCIRC, 11-13 September, Munich, Germany, 2007, p. 296.
    • I. Diehl, K. Hansen, C. Reckleben, ESSCIRC, 11-13 September, Munich, Germany, 2007, p. 296.
  • 11
    • 42049090622 scopus 로고    scopus 로고
    • C. Reckleben, K. Hansen, I. Diehl, H. Klär, E. Welter, IEEE NSS 2007, 28th October-3rd November, Honolulu, HI, USA, No. 1420, 2007.
    • C. Reckleben, K. Hansen, I. Diehl, H. Klär, E. Welter, IEEE NSS 2007, 28th October-3rd November, Honolulu, HI, USA, No. 1420, 2007.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.