Dynamic Behavior of the Charge-to-Voltage Conversion in Si-Drift Detectors with Integrated JFETs

IEEE Transactions on Nuclear Science

Volumn 50, Issue 5 III, 2003, Pages 1718-1724

  Hansen, Karsten ^a   Reckleben, Christian ^a  

^a DESY   (Germany)

Author keywords

Charge restoration; Charge sensitivity; Continuous reset; Silicon drift detector; X ray spectroscopy

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; JUNCTION GATE FIELD EFFECT TRANSISTORS; PHOTONS; SILICON; X RAY SPECTROSCOPY;

VOLTAGE CONVERSION;

RADIATION DETECTORS;

EID: 0142063386     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2003.818268     Document Type: Article

References (12)

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