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Volumn 14, Issue 2, 2008, Pages 498-504

Transmission-type laser THz emission microscope using a solid immersion lens

Author keywords

Femtosecond (fs) laser; Microscopy; Solid immersion lens (SIL); Terahertz (THz)

Indexed keywords

IMAGING SYSTEMS; INTEGRATED CIRCUITS; MICROSCOPES; REFRACTIVE INDEX; TRANSMISSION ELECTRON MICROSCOPY; ULTRASHORT PULSES;

EID: 41949136228     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSTQE.2007.913425     Document Type: Article
Times cited : (43)

References (21)
  • 1
    • 21544439607 scopus 로고
    • Imaging with terahertz waves
    • Aug
    • B. B. Hu and M. C. Nuss, "Imaging with terahertz waves," Opt. Lett., vol. 20, no. 16, pp. 1716-1718, Aug. 1995.
    • (1995) Opt. Lett , vol.20 , Issue.16 , pp. 1716-1718
    • Hu, B.B.1    Nuss, M.C.2
  • 4
    • 0036769849 scopus 로고    scopus 로고
    • Materials for terahertz science and technology
    • Sep
    • B. Ferguson and X.-D. Zang, "Materials for terahertz science and technology," Nat. Mater., vol. 1, pp. 26-32, Sep. 2002.
    • (2002) Nat. Mater , vol.1 , pp. 26-32
    • Ferguson, B.1    Zang, X.-D.2
  • 5
    • 34247174373 scopus 로고    scopus 로고
    • Cutting-edge terahertz technology
    • Feb
    • M. Tonouchi, "Cutting-edge terahertz technology," Nat. Photon., vol. 1, pp. 97-105, Feb. 2007.
    • (2007) Nat. Photon , vol.1 , pp. 97-105
    • Tonouchi, M.1
  • 7
    • 30344488438 scopus 로고    scopus 로고
    • Terahertz near-field imaging using enhanced transmission through a single subwavelength aperture
    • Jul
    • K. Ishihara, T. Ikari, H. Minamide, J. Shikata, K. Ohashi, H. Yokoyama, and H. Ito, "Terahertz near-field imaging using enhanced transmission through a single subwavelength aperture," Jpn. J. Appl. Phys., vol. 44, pp. L929-L931, Jul. 2005.
    • (2005) Jpn. J. Appl. Phys , vol.44
    • Ishihara, K.1    Ikari, T.2    Minamide, H.3    Shikata, J.4    Ohashi, K.5    Yokoyama, H.6    Ito, H.7
  • 8
    • 79956020917 scopus 로고    scopus 로고
    • Electro-optic detection of subwavelength terahertz spot sizes in. the near field of a metal tip
    • Aug
    • N. C. J. Van Der Valk and P. C. M. Planken, "Electro-optic detection of subwavelength terahertz spot sizes in. the near field of a metal tip," Appl. Phys. Lett., vol. 81, pp. 1558-1560, Aug. 2002.
    • (2002) Appl. Phys. Lett , vol.81 , pp. 1558-1560
    • Van Der Valk, N.C.J.1    Planken, P.C.M.2
  • 10
  • 11
    • 0031249523 scopus 로고    scopus 로고
    • Design and performance of singular electric field terahertz photoconducting antennas
    • Oct
    • Y. Cal, I. Brener, J. Lopata, J. Wynn, and L. Pfeiffer, "Design and performance of singular electric field terahertz photoconducting antennas," Appl. Phys. Lett., vol. 71, pp. 2076-2078, Oct. 1997.
    • (1997) Appl. Phys. Lett , vol.71 , pp. 2076-2078
    • Cal, Y.1    Brener, I.2    Lopata, J.3    Wynn, J.4    Pfeiffer, L.5
  • 14
    • 0242269961 scopus 로고    scopus 로고
    • Laser terahertz emission microscope for inspecting electrical failures in integrated circuits
    • Nov
    • T. Kiwa, M. Tonouchi, M. Yamashita, and K. Kawase, "Laser terahertz emission microscope for inspecting electrical failures in integrated circuits," Opt. Lett., vol. 28, pp. 2058-2060, Nov. 2003.
    • (2003) Opt. Lett , vol.28 , pp. 2058-2060
    • Kiwa, T.1    Tonouchi, M.2    Yamashita, M.3    Kawase, K.4
  • 15
    • 13544254534 scopus 로고    scopus 로고
    • Imaging of large-scale integrated circuits using laser terahertz emission microscopy
    • Jan
    • M. Yamashita, K. Kawase, C. Otani, T. Kiwa, and M. Tonouchi, "Imaging of large-scale integrated circuits using laser terahertz emission microscopy," Opt. Express, vol. 13, pp. 115-120, Jan. 2005.
    • (2005) Opt. Express , vol.13 , pp. 115-120
    • Yamashita, M.1    Kawase, K.2    Otani, C.3    Kiwa, T.4    Tonouchi, M.5
  • 17
    • 34247464269 scopus 로고    scopus 로고
    • Scanning probe laser terahertz emission microscopy system
    • Oct
    • R. Inoue, N. Uchida, and M. Tonouchi, "Scanning probe laser terahertz emission microscopy system," Jpn. J. Appl. Phys., vol. 45, no. 31, pp. L824-L826, Oct. 2006.
    • (2006) Jpn. J. Appl. Phys , vol.45 , Issue.31
    • Inoue, R.1    Uchida, N.2    Tonouchi, M.3
  • 19
    • 24144493169 scopus 로고    scopus 로고
    • K. Sakai, Ed, New York: Springer-Verlag, ch. 1
    • K. Sakai, Ed., Terahertz Optoelectronics. New York: Springer-Verlag, 2005, ch. 1.
    • (2005) Terahertz Optoelectronics
  • 20
    • 0000607560 scopus 로고
    • Optoelectronic measurement of semiconductor surfaces and interfaces with, femtosecond optics
    • Jan
    • X.-C. Zang and D. H. Auston, "Optoelectronic measurement of semiconductor surfaces and interfaces with, femtosecond optics," J. Appl. Phys., vol. 71, pp. 326-338, Jan. 1992.
    • (1992) J. Appl. Phys , vol.71 , pp. 326-338
    • Zang, X.-C.1    Auston, D.H.2
  • 21
    • 0037945478 scopus 로고    scopus 로고
    • Solid immersion lens-enhanced nano-photoluminescence: Principle and applications
    • May
    • S. Moehl, H. Zhao, B. D. Don, S. Wachter, and H. Kalt, "Solid immersion lens-enhanced nano-photoluminescence: Principle and applications," J. Appl. Phys., vol. 93, pp. 6265-6272, May 2003.
    • (2003) J. Appl. Phys , vol.93 , pp. 6265-6272
    • Moehl, S.1    Zhao, H.2    Don, B.D.3    Wachter, S.4    Kalt, H.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.