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Volumn 1, Issue , 2006, Pages 449-452

Transient ion drift measurements of polycrystalline CdTe PV devices

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM ALLOYS; COPPER; DIFFUSION; PHOTOVOLTAIC CELLS;

EID: 41749110904     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/WCPEC.2006.279487     Document Type: Conference Paper
Times cited : (11)

References (14)
  • 1
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    • Study of Potential Cost Reductions resulting from Super-Large-Scale Manufacturing of PV Modules
    • Sept
    • M.S. Keshner and R. Arya, "Study of Potential Cost Reductions resulting from Super-Large-Scale Manufacturing of PV Modules", Final Subcontract Report, NREUSR-520-36846 Sept. 2004
    • (2004) Final Subcontract Report, NREUSR-520-36846
    • Keshner, M.S.1    Arya, R.2
  • 5
    • 27944502619 scopus 로고    scopus 로고
    • Consistent Processing and Long Term Stability of CdTe Devices
    • st IEEE PVSC, 2005, pp. 323-326
    • (2005) st IEEE PVSC , pp. 323-326
    • Barth, K.L.1
  • 6
    • 41749108470 scopus 로고    scopus 로고
    • An overview of the CdTe - CIGS thin film solar cell program at the University of South Florida
    • K. Barri et al.,"An overview of the CdTe - CIGS thin film solar cell program at the University of South Florida", NCPV and Solar Program Review, 2003, pp. 886
    • (2003) NCPV and Solar Program Review , pp. 886
    • Barri, K.1
  • 7
    • 79955987473 scopus 로고    scopus 로고
    • Cathodoluminescence of Cu Diffusion in CdTe Thin Films for CdTe/CdS Solar Cells
    • M.J. Romero, D. S. Albin, M. M. Al -Jassim, and X.Wu, "Cathodoluminescence of Cu Diffusion in CdTe Thin Films for CdTe/CdS Solar Cells", Appl. Phys. Let. 81, (16), 2002, pp. 2962-2964
    • (2002) Appl. Phys. Let , vol.81 , Issue.16 , pp. 2962-2964
    • Romero, M.J.1    Albin, D.S.2    Al -Jassim, M.M.3    Wu, X.4
  • 8
    • 0001410892 scopus 로고    scopus 로고
    • Room-temperature detection of mobile impurities in compound semiconductors by transient ion drift
    • I. Lyubomirsky, et al., "Room-temperature detection of mobile impurities in compound semiconductors by transient ion drift", J. Appl. Phys. 81 (10), 1997, pp. 6684-6691
    • (1997) J. Appl. Phys , vol.81 , Issue.10 , pp. 6684-6691
    • Lyubomirsky, I.1
  • 9
    • 36849103524 scopus 로고
    • Some Diffusion and Solubility Measurements of Cu in CdTe
    • H. Woodbury and M. Aven, "Some Diffusion and Solubility Measurements of Cu in CdTe", J. Appl. Phys., 39, (12), 1968, pp. 5485-5488
    • (1968) J. Appl. Phys , vol.39 , Issue.12 , pp. 5485-5488
    • Woodbury, H.1    Aven, M.2
  • 10
    • 0001418353 scopus 로고    scopus 로고
    • Transient ion-drift-induced capacitance signals in semiconductors
    • T. Heiserand E.R. Weber, "Transient ion-drift-induced capacitance signals in semiconductors", Phys. R. B, 58 (7), 1998, pp. 3893-3903
    • (1998) Phys. R. B , vol.58 , Issue.7 , pp. 3893-3903
    • Heiserand, T.1    Weber, E.R.2
  • 14
    • 0343913988 scopus 로고    scopus 로고
    • Intrinsic Diffusion Coefficient of Interstitial Copper in Silicon
    • A.A. Istratov, C. Flink, H. Hieslmair, E.R. Weber, "Intrinsic Diffusion Coefficient of Interstitial Copper in Silicon", Phys. Rev. B. Let., 81, (6), 1998, pp. 1243-1246
    • (1998) Phys. Rev. B. Let , vol.81 , Issue.6 , pp. 1243-1246
    • Istratov, A.A.1    Flink, C.2    Hieslmair, H.3    Weber, E.R.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.