Advances in continuous, in-line processing of stable CdS/CdTe devices

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2002, Pages 551-554

  Barth, Kurt L ^a   Enzenroth, R A ^a   Sampath, W S ^a  

^a Department of Environmental and Radiological Health Sciences   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIREFLECTION COATINGS; CADMIUM SULFIDE; HEAT TREATMENT; OHMIC CONTACTS; SEMICONDUCTING CADMIUM TELLURIDE; STRESS ANALYSIS; VACUUM APPLICATIONS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

GLANCING ANGLE X RAY DIFFRACTION; INDOOR STRESS TESTING; PILOT SCALE SYSTEM;

PHOTOVOLTAIC CELLS;

EID: 0036948638     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. W. S. Sampath, K. L. Barth and R. A. Enzenroth, "Continuous In-Line Processing of Stable CdS/CdTe Devices", NCPV Prog. Review Meeting, 2001, www.nrel.gov/ncpv_prm/pdfs/papers/77.pdf
2. T.J. McMahon and G.J. Jorgensen, "Progress Towards a CdTe Cell Life Prediction", Proceedings of the 15th NREL Photovoltaic Review, 1998, pp. 54-61.
3. Chusuei, Charles C., Kurt L. Barth, Robert A. Enzenroth and Walajabad S. Sampath, "Surface Characterization of a Cu-Doped CdTe/CdS Solar Cell" Submitted to Journal Appl. Physics, March 2002.
4. E.P. Domashevskaya, Gorbachev, V.V.; Terekhov, V.A.; Kashkarov, V.M.; Panfilova, E.V.; Schuckarev, A.V. J. Electron Spectrosc. Relat. Phenom. 2001, 114-116, 901-908.
5. D.M. Waters, "CdTe/CdS Solar Cells: Surface Analyses of CdTe Prior to Contact Formation", Thesis U. of Calif., Santa Cruz, 1998.