A study of stray minority carrier diffusion in CMOS image sensors

IEEE Electron Device Letters

Volumn 29, Issue 4, 2008, Pages 341-343

  Lin, Dong Long ^a   Wang, Ching Chun ^a   Wei, Chia Ling ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Penetration depth; Single chip CMOS image sensors; Stray minority carrier diffusion

Indexed keywords

CMOS INTEGRATED CIRCUITS; MICROPROCESSOR CHIPS; MOSFET DEVICES; NOISE ABATEMENT; OPTIMIZATION; SUBSTRATES; SWITCHING FREQUENCY;

CMOS IMAGE SENSORS; NOISE MINIMIZATION; STRAY MINORITY CARRIER DIFFUSION;

IMAGE SENSORS;

EID: 41749088249     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2008.917628     Document Type: Article

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