Perturbative refinement of the geometric calibration in pinhole SPECT

IEEE Transactions on Medical Imaging

Volumn 27, Issue 2, 2008, Pages 204-214

  Defrise, Michel ^a   Vanhove, Christian ^a   Nuyts, Johan ^b  

^a VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

Calibration; Pinhole imaging; Single photon emission computed tomography (SPECT)

Indexed keywords

CALIBRATION METHOD; CALIBRATION SOURCE; GAMMA CAMERAS; GEOMETRIC CALIBRATIONS; GEOMETRIC PARAMETER; MICRO SPECT; PARAMETRIC CALIBRATION; PINHOLE IMAGING; PINHOLE SPECT; RIGID BODY TRANSFORMATION;

CALIBRATION; CAMERAS; GEOMETRY;

SINGLE PHOTON EMISSION COMPUTED TOMOGRAPHY;

ALGORITHM; ARTICLE; BELGIUM; CALIBRATION; COMPUTER ASSISTED DIAGNOSIS; IMAGE ENHANCEMENT; INSTRUMENTATION; METHODOLOGY; REPRODUCIBILITY; SCINTILLATION CAMERA; SENSITIVITY AND SPECIFICITY; SINGLE PHOTON EMISSION COMPUTER TOMOGRAPHY; STANDARD;

ALGORITHMS; BELGIUM; CALIBRATION; GAMMA CAMERAS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; TOMOGRAPHY, EMISSION-COMPUTED, SINGLE-PHOTON;

EID: 41649105865     PISSN: 02780062     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMI.2007.904687     Document Type: Article

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